Crystal growth and dielectric measurement of KH₂P O₄
dc.contributor.author | Mallango, Edward A. J. S. | |
dc.date.accessioned | 2021-02-09T11:36:28Z | |
dc.date.available | 2021-02-09T11:36:28Z | |
dc.date.issued | 1976 | |
dc.description | Available in print form, EAF collection, Dr. Wilbert Chagula Library (THS EAF QD 921.M2) | en_US |
dc.description.abstract | Growth of potassium dihydrogen phosphate (KH₂P O₄) crystals from a saturated solution by a simple temperature decrease method is presented. The temperature dependence of the dielectric constant for a number of specimens are calculated from capacitance measurements is also presented. Both the overall feature of our results and transition temperatures which were within the range of 118.5˚K and 123.5˚K are in good agreement with values found in the literature. Using d.c bias fields, the transition temperature has been observed to shift to lower values. Dielectric measurements obtained in the neighbourhood of the transition temperatures indicate a first order transition in potassium dihydrogen phosphate in agreement with recent findings of other workers. | en_US |
dc.identifier.citation | Mallango, Edward A. J. S (1976) Crystal growth and dielectric measurement of KH₂P O₄ ,Masters dissertation, University of Dar es Salaam, Dar es Salaam | en_US |
dc.identifier.uri | http://41.86.178.5:8080/xmlui/handle/123456789/14691 | |
dc.language.iso | en | en_US |
dc.publisher | University of Dar es Salaam | en_US |
dc.subject | Crystals | en_US |
dc.subject | Growth | en_US |
dc.subject | Potassium phosphates | en_US |
dc.title | Crystal growth and dielectric measurement of KH₂P O₄ | en_US |
dc.type | Thesis | en_US |
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